材料制造和加工专注于生产具有非常特异性的材料。通常，这些材料更强，更轻，更有效地制造。为方便这些要求，需要详细分析材料，这可以作为材料开发的一部分或作为质量控制的一部分。该分析包括了解材料内的化学和相组成，晶粒结构和菌株。

Oxford Instruments provides tools which are designed to deliver the required results in these challenging markets. For example, there is often a requirement to investigate large sample areas to deliver adequate sampling statistics, on samples being produced in bulk. This is made possible through the AZtec large area mapping solution, where many hundreds of fields are analysed automatically through unattended data collection and then montaged together to provide a real overview of the sample.

Similarly, automated analysis and classification of inclusions or secondary phases have now become routine, for example, the analysis of steel inclusions to recognised standards.

类似地，随着材料的处理，纳米级的表征是需要的，因为晶粒和颗粒尺寸在工程化材料中降低。这是探测器技术的发展：

• Large area (up to 170 mm²) and multiple SDD based Ultim Max and X-Max EDS detectors
• CMOS based Symmetry EBSD detectors, which combine sensitive & fast (3000 Hz) data acquisition
• 两种技术开发用于快速映射，低kV /光束电流，高灵敏度分析

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