- 按模式搜索 - 显微镜供应 - 万博手机版max客户端,万博手机登录网,万博电脑网页版登录

Conductive silicon probe with visible tip apex for contact mode electrical measurements.

Each pack contains 10 probes. This product is not in stock but you can order it and it will take around two weeks to get delivered.
, Electrostatic Force Microscopy (EFM), Loss Tangent Imaging, AM-FM Viscoelastic Mapping, Lateral Force Microscopy (LFM), Time Dependent Dielectric Breakdown (TDDB), Scanning Capacitance Mode (SCM), Contact Resonance Viscoelastic Mapping, Nanolithography, Force Curves - Contact, Electrochemical Strain Microscopy (ESM), Video-Rate AFM, Force Modulation, Scanning Tunneling Microscopy (STM), Force Maps, Electrochemical AFM (EC-AFM), Thermal Mechanical Nanoindentation (TMNI), Tapping Mode, Conductive AFM (CAFM), Fast Force Mapping (FFM), Piezoresponse Force Microscopy (PFM), Kelvin Probe Force Microscopy (KPFM), Scanning Thermal Microscopy (SThM), Fast Current Mapping, Magnetic Force Microscopy (MFM), Contact Mode, Higher Eigenmode Tapping, Bimodal Dual AC- Search by ModeMICROSCOPY SUPPLIES "> - 按模式搜索 - 显微镜供应 - 万博手机版max客户端,万博手机登录网,万博电脑网页版登录